"Tunneling component suppression in charge pumping measurement and ..."

Chun-Chang Lu et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.04.021

access: closed

type: Journal Article

metadata version: 2020-02-22

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Chun-Chang Lu, Kuei-Shu Chang-Liao, Chun-Yuan Lu, Shih-Cheng Chang, Tien-Ko Wang, Fu-Chung Hou, Yao-Tung Hsu:
Tunneling component suppression in charge pumping measurement and reliability study for high-k gated MOSFETs. Microelectron. Reliab. 51(12): 2110-2114 (2011)

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