"A new erase method for scaled NAND flash memory device."

Chan-Ching Lin et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.03.031

access: closed

type: Journal Article

metadata version: 2020-02-22

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Chan-Ching Lin, Kuei-Shu Chang-Liao, Tzung-Bin Huang, Cheng-Jung Yu, Hsueh-Chao Ko:
A new erase method for scaled NAND flash memory device. Microelectron. Reliab. 72: 34-38 (2017)

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