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"Front Side and Backside OBIT Mappings applied to Single Event Transient ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Dean Lewis et al. (2001)

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DOI: 10.1016/S0026-2714(01)00198-6

access: closed

type: Journal Article

metadata version: 2025-01-19

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  - https://dblp.org/rec/journals/mr/LewisPBLFTBP01
Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu:
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectron. Reliab. 41(9-10): 1471-1476 (2001)

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last updated on 2025-01-19 14:54 CET by the dblp team

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