"Temperature effects on the ruggedness of SiC Schottky diodes under surge ..."

Javier Leon et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.07.020

access: closed

type: Journal Article

metadata version: 2020-02-22

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Javier Leon, Xavier Perpiñà, Viorel Banu, Josep Montserrat, Maxime Berthou, Miquel Vellvehí, Philippe Godignon, Xavier Jordà:
Temperature effects on the ruggedness of SiC Schottky diodes under surge current. Microelectron. Reliab. 54(9-10): 2207-2212 (2014)

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