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ORCID"Conduction instability of amorphous InGaZnO thin-film transistors under ..."
- Jung Han Kang, Edward Namkyu Cho, Ilgu Yun:
Conduction instability of amorphous InGaZnO thin-film transistors under constant drain current stress. Microelectron. Reliab. 54(9-10): 2164-2166 (2014)
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