"Reliability/Uniformity improvement induced by an ultrathin TiO2 ..."

Ran Jiang, Zuyin Han, Xianghao Du (2016)

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DOI: 10.1016/J.MICROREL.2016.05.013

access: closed

type: Journal Article

metadata version: 2020-02-22

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Ran Jiang, Zuyin Han, Xianghao Du:
Reliability/Uniformity improvement induced by an ultrathin TiO₂ insertion in Ti/HfO₂/Pt resistive switching memories. Microelectron. Reliab. 63: 37-41 (2016)

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