default search action

combined dblp search
author search
venue search
publication search

ask others

"Hot carrier degradation behavior in SOI dynamic-threshold-voltage ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Ru Huang et al. (2003)

> Home

Details and statistics

DOI: 10.1016/S0026-2714(03)00038-6

access: closed

type: Journal Article

metadata version: 2024-06-04

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/HuangWHYZW03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/HuangWHYZW03
Ru Huang, Jinyan Wang, Jin He, Min Yu, Xing Zhang, Yangyuan Wang:
Hot carrier degradation behavior in SOI dynamic-threshold-voltage nMOSFET's (n-DTMOSFET) measured by gated-diode configuration. Microelectron. Reliab. 43(5): 707-711 (2003)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.

last updated on 2024-06-04 17:15 CEST by the dblp team

all metadata released as open data under CC0 1.0 license

see also: Terms of Use | Privacy Policy | Imprint

dblp was originally created in 1993 at:

since 2018, dblp has been operated, funded, and maintained by:

Schloss Dagstuhl - Leibniz Center for Informatics is a member of the Leibniz Association and is funded by the federal government of Germany and the states of Germany, especially Saarland and Rhineland‑Palatinate.