"Transient analysis of latent damage formation in SMD capacitors by ..."

Dennis Helmut, Gerhard K. M. Wachutka, Gerhard Groos (2017)

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DOI: 10.1016/J.MICROREL.2017.06.076

access: closed

type: Journal Article

metadata version: 2022-10-16

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Dennis Helmut, Gerhard K. M. Wachutka, Gerhard Groos:
Transient analysis of latent damage formation in SMD capacitors by Transmission Line Pulsing (TLP). Microelectron. Reliab. 76-77: 97-101 (2017)

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