"Investigation on BIST assisted failure analysis on digital integrated ..."

Claus Hartmann, M. Wieberneit (2010)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2010.07.148

access: closed

type: Journal Article

metadata version: 2020-09-04

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/HartmannW10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/HartmannW10
Claus Hartmann, M. Wieberneit:
Investigation on BIST assisted failure analysis on digital integrated circuits. Microelectron. Reliab. 50(9-11): 1464-1468 (2010)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.