"Comprehensive failure analysis of leakage faults in bipolar transistors."

Bernadette Domengès et al. (2002)

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DOI: 10.1016/S0026-2714(02)00167-1

access: closed

type: Journal Article

metadata version: 2020-02-22

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Bernadette Domengès, P. Schwindenhammer, Patrick Poirier, Felix Beaudoin, Philippe Descamps:
Comprehensive failure analysis of leakage faults in bipolar transistors. Microelectron. Reliab. 42(9-11): 1449-1452 (2002)

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