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"Analytical analysis of nanoscale multiple gate MOSFETs including effects ..."
Fayçal Djeffal et al. (2009)
- Fayçal Djeffal, Z. Ghoggali, Zohir Dibi, N. Lakhdar:

Analytical analysis of nanoscale multiple gate MOSFETs including effects of hot-carrier induced interface charges. Microelectron. Reliab. 49(4): 377-381 (2009)

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