"Analysis of wire bond and metallization degradation mechanisms in DMOS ..."

Thomas Detzel, Michael Glavanovics, Karin Weber (2004)

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DOI: 10.1016/J.MICROREL.2004.07.044

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type: Journal Article

metadata version: 2024-10-06

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Thomas Detzel, Michael Glavanovics, Karin Weber:
Analysis of wire bond and metallization degradation mechanisms in DMOS power transistors stressed under thermal overload conditions. Microelectron. Reliab. 44(9-11): 1485-1490 (2004)

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