"Electrical aging behavioral modeling for reliability analyses of ionizing ..."

Corinne Bestory et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.07.025

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type: Journal Article

metadata version: 2020-02-22

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Corinne Bestory, François Marc, S. Duzellier, Hervé Levi:
Electrical aging behavioral modeling for reliability analyses of ionizing dose effects on an n-MOS simple current mirror. Microelectron. Reliab. 49(9-11): 946-951 (2009)

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