"Coupled measurement-simulation procedure for very high power fast recovery ..."

Fulvio Bertoluzza et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.123

access: closed

type: Journal Article

metadata version: 2020-02-22

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Fulvio Bertoluzza, Paolo Cova, Nicola Delmonte, Pietro Pampili, Marco Portesine:
Coupled measurement-simulation procedure for very high power fast recovery - Soft behavior diode design and testing. Microelectron. Reliab. 50(9-11): 1720-1724 (2010)

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