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"Characteristics degradation of the SiGe HBT under electromagnetic field ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Ali Alaeddine et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.002

access: closed

type: Journal Article

metadata version: 2025-08-19

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Ali Alaeddine, Moncef Kadi, Kaouther Daoud, B. Beydoun:
Characteristics degradation of the SiGe HBT under electromagnetic field stress. Microelectron. Reliab. 50(12): 1961-1966 (2010)

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