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"Electromigration degradation modeling in 3D power chiplets with coupled ..."
Han Wang et al. (2026)
- Han Wang, Yulin Wu, Xianzhi Wang, Shu Yang, Na Bai:

Electromigration degradation modeling in 3D power chiplets with coupled electro-thermal effects. Microelectron. J. 175: 107231 (2026)

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