"Analysis on electrical parameters including temperature and interface trap ..."

Rajesh Saha, Rupam Goswami, Deepak Kumar Panda (2022)

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DOI: 10.1016/J.MEJO.2022.105629

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type: Journal Article

metadata version: 2024-10-06

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Rajesh Saha, Rupam Goswami, Deepak Kumar Panda:
Analysis on electrical parameters including temperature and interface trap charges in gate overlap Ge source step shape double gate TFET. Microelectron. J. 130: 105629 (2022)

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