"Maximizing Interconnect Bandwidth and Efficiency in Nonvolatile Memory, ..."

Junhyeok Park et al. (2025)

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DOI: 10.1109/MM.2025.3572475

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type: Journal Article

metadata version: 2026-01-09

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Junhyeok Park, Chang-Gyu Lee, Soon Hwang, Seung-Jun Cha, Woosuk Chung, Youngjae Kim:
Maximizing Interconnect Bandwidth and Efficiency in Nonvolatile Memory, Express-Based Key-Value Solid-State Devices With Fine-Grained Value Transfer. IEEE Micro 45(6): 82-90 (2025)

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