"A comparison of measurement and defect characteristics of new and legacy ..."

Jeff Tian, Joel Troster (1998)

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DOI: 10.1016/S0164-1212(98)10050-X

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type: Journal Article

metadata version: 2020-02-24

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Jeff Tian, Joel Troster:
A comparison of measurement and defect characteristics of new and legacy software systems. J. Syst. Softw. 44(2): 135-146 (1998)

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