"基于PTM模型与BN模型的Ĭ..."

Yufang Jiang, Zuoxiang Deng (2015)

> Home

Details and statistics

DOI: Y2015/V42/IZ6/115

access: open

type: Journal Article

metadata version: 2020-04-27

- view
  - electronic edition @ jsjkx.com (open access)
  - electronic edition @ jsjkx.com (open access)
  authority control:
- export record
  dblp key:
  - journals/jsjkx/JiangD15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jsjkx/JiangD15
Yufang Jiang, Zuoxiang Deng:
基于PTM模型与BN模型的电路可靠性计算方法比较 (Comparison of Circuit Reliability Calculation Methods Based on PTM Model and BN Model). 计算机科学 42(Z6): 115-117 (2015)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.