"IM-YOLO: lowering missed detections in real time for tiny defect ..."

Zhong Xiang et al. (2026)

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DOI: 10.1007/S11554-026-01872-6

access: closed

type: Journal Article

metadata version: 2026-05-09

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Zhong Xiang, Fengxin Yan, Ziliang Peng, Junru Wang:
IM-YOLO: lowering missed detections in real time for tiny defect inspection on paper containers. J. Real Time Image Process. 23(2): 80 (2026)

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