"Recovery modeling of negative bias temperature instability (NBTI) for ..."

Haldun Küflüoglu et al. (2014)

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DOI: 10.1145/2517648

access: closed

type: Journal Article

metadata version: 2020-06-08

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Haldun Küflüoglu, Cathy Chancellor, Min Chen, Claude Cirba, Vijay Reddy:
Recovery modeling of negative bias temperature instability (NBTI) for SPICE-compatible circuit aging simulators. ACM J. Emerg. Technol. Comput. Syst. 10(1): 2:1-2:16 (2014)

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