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"Analysis and modeling for MOSFET degradation under RF stress."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Haipeng Fu et al. (2021)

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DOI: 10.1587/ELEX.18.20210116

access: open

type: Journal Article

metadata version: 2022-02-03

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  - electronic edition via DOI (open access)
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  dblp key:
  - journals/ieiceee/FuYNLM21
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  persistent URL:
  - https://dblp.org/rec/journals/ieiceee/FuYNLM21
Haipeng Fu, Liping Yang, Muqian Niu, Xuguang Li, Kaixue Ma:
Analysis and modeling for MOSFET degradation under RF stress. IEICE Electron. Express 18(8): 20210116 (2021)

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