"Digital-Compatible Testing Scheme for Operational Amplifier."

Hsin-Wen Ting (2012)

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DOI: 10.1007/S10836-012-5290-7

access: closed

type: Journal Article

metadata version: 2020-09-11

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Hsin-Wen Ting:
Digital-Compatible Testing Scheme for Operational Amplifier. J. Electron. Test. 28(3): 267-277 (2012)

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