"Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test ..."

Soham Roy et al. (2020)

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DOI: 10.1007/S10836-020-05859-4

access: closed

type: Journal Article

metadata version: 2020-09-11

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Soham Roy, Brandon Stiene, Spencer K. Millican, Vishwani D. Agrawal:
Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures. J. Electron. Test. 36(1): 123-133 (2020)

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