"Built-In Self-Test Design for the 3D-Stacked Wide-I/O DRAM."

Kun-Lun Luo et al. (2016)

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DOI: 10.1007/S10836-016-5570-8

access: closed

type: Journal Article

metadata version: 2020-09-11

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Kun-Lun Luo, Ming-Hsueh Wu, Chun-Lung Hsu, Chen-An Chen:
Built-In Self-Test Design for the 3D-Stacked Wide-I/O DRAM. J. Electron. Test. 32(2): 111-123 (2016)

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