"Transparent random access memory testing for pattern sensitive faults."

Mark G. Karpovsky, Vyacheslav N. Yarmolik (1996)

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DOI: 10.1007/BF00134690

access: closed

type: Journal Article

metadata version: 2020-09-11

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Mark G. Karpovsky, Vyacheslav N. Yarmolik:
Transparent random access memory testing for pattern sensitive faults. J. Electron. Test. 9(3): 251-266 (1996)

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