"Automated Functional Test Generation for Digital Systems Through a Compact ..."

Alfonso Martínez-Cruz et al. (2015)

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DOI: 10.1007/S10836-015-5540-6

access: closed

type: Journal Article

metadata version: 2025-04-01

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Alfonso Martínez-Cruz, Ricardo Barrón Fernández, Herón Molina-Lozano, Marco Antonio Ramírez Salinas, Luis Alfonso Villa Vargas:
Automated Functional Test Generation for Digital Systems Through a Compact Binary Differential Evolution Algorithm. J. Electron. Test. 31(4): 361-380 (2015)

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