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"Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Ahcène Bounceur et al. (2007)

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DOI: 10.1007/S10836-007-5006-6

access: closed

type: Journal Article

metadata version: 2020-09-11

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Ahcène Bounceur, Salvador Mir, Emmanuel Simeu, Luís Rolíndez:
Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing. J. Electron. Test. 23(6): 471-484 (2007)

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