"The D-Day, V-Day, and bleak days of a disruptive technology: A new model ..."

Chialin Chen, Jun Zhang, Ruey-Shan Guo (2016)

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DOI: 10.1016/J.EJOR.2015.11.023

access: closed

type: Journal Article

metadata version: 2020-02-21

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Chialin Chen, Jun Zhang, Ruey-Shan Guo:
The D-Day, V-Day, and bleak days of a disruptive technology: A new model for ex-ante evaluation of the timing of technology disruption. Eur. J. Oper. Res. 251(2): 562-574 (2016)

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