"Guest Editor's Introduction: Microprocessor Testing Today."

Wayne M. Needham (1998)

> Home

Details and statistics

DOI: —

access: unavailable

type: Journal Article

metadata version: 2020-05-17

- no documents available
- export record
  dblp key:
  - journals/dt/Needham98
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/dt/Needham98
Wayne M. Needham:
Guest Editor's Introduction: Microprocessor Testing Today. IEEE Des. Test Comput. 15(3): 56-57 (1998)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.