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"Physical Techniques for Chip-Backside IC Debug in Nanotechnologies."
Christian Boit et al. (2008)
- Christian Boit, Rudolf Schlangen, Uwe Kerst, Ted R. Lundquist:

Physical Techniques for Chip-Backside IC Debug in Nanotechnologies. IEEE Des. Test Comput. 25(3): 250-257 (2008)

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