"Lifetime Reliability Enhancement of Microprocessors: Mitigating the Impact ..."

Hyejeong Hong et al. (2015)

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DOI: 10.1145/2785988

access: closed

type: Journal Article

metadata version: 2025-11-15

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Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang:
Lifetime Reliability Enhancement of Microprocessors: Mitigating the Impact of Negative Bias Temperature Instability. ACM Comput. Surv. 48(1): 9:1-9:25 (2015)

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