default search action

combined dblp search
author search
venue search
publication search

ask others

"Thermal Reliability Analysis for 7-nm FinFET Based Positive Edge Triggered ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Syeda Hurmath Juveria, J. Ajayan, Shashank Rebelli (2026)

> Home

Details and statistics

DOI: 10.1007/S00034-025-03357-6

access: closed

type: Journal Article

metadata version: 2026-06-03

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/cssp/JuveriaAR26
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/cssp/JuveriaAR26
Syeda Hurmath Juveria, J. Ajayan, Shashank Rebelli:
Thermal Reliability Analysis for 7-nm FinFET Based Positive Edge Triggered TSPC Flip-Flop for Future IoT and AI Applications. Circuits Syst. Signal Process. 45(4): 3036-3050 (2026)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.

last updated on 2026-06-03 20:27 CEST by the dblp team

all metadata released as open data under CC0 1.0 license

see also: Terms of Use | Privacy Policy | Imprint

dblp was originally created in 1993 at:

since 2018, dblp has been operated, funded, and maintained by:

Schloss Dagstuhl - Leibniz Center for Informatics is a member of the Leibniz Association and is funded by the federal government of Germany and the states of Germany, especially Saarland and Rhineland‑Palatinate.