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"EPIC: Efficient prediction of IC manufacturing hotspots with a unified ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Duo Ding et al. (2014)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2018-08-13

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/DingYGP14
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  persistent URL:
  - https://dblp.org/rec/journals/corr/DingYGP14
Duo Ding, Bei Yu, Joydeep Ghosh, David Z. Pan:
EPIC: Efficient prediction of IC manufacturing hotspots with a unified meta-classification formulation. CoRR abs/1402.2904 (2014)

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last updated on 2018-08-13 16:46 CEST by the dblp team

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