"Design for manufacturability and reliability in extreme-scaling VLSI."

Bei Yu et al. (2016)

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DOI: 10.1007/S11432-016-5560-6

access: closed

type: Journal Article

metadata version: 2020-03-02

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Bei Yu, Xiaoqing Xu, Subhendu Roy, Yibo Lin, Jiaojiao Ou, David Z. Pan:
Design for manufacturability and reliability in extreme-scaling VLSI. Sci. China Inf. Sci. 59(6): 061406:1-061406:23 (2016)

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