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"Measurement and Analysis of Scattering From Slightly Rough Dielectric ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Riku Yoshino et al. (2026)

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DOI: 10.1109/ACCESS.2026.3681775

access: open

type: Journal Article

metadata version: 2026-04-26

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  dblp key:
  - journals/access/YoshinoCIK26
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  - https://dblp.org/rec/journals/access/YoshinoCIK26
Riku Yoshino, Jerdvisanop Chakarothai, Keizo Inagaki, Tetsuya Kawanishi:
Measurement and Analysis of Scattering From Slightly Rough Dielectric Surfaces in 100- and 300-GHz Bands. IEEE Access 14: 54014-54022 (2026)

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