"Investigation of Negative Bias Temperature Instability Effect in Partially ..."

Chao Peng et al. (2020)

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DOI: 10.1109/ACCESS.2020.2997463

access: open

type: Journal Article

metadata version: 2025-04-22

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Chao Peng, Zhifeng Lei, Rui Gao, Zhangang Zhang, Yiqiang Chen, Yunfei En, Yun Huang:
Investigation of Negative Bias Temperature Instability Effect in Partially Depleted SOI pMOSFET. IEEE Access 8: 99037-99046 (2020)

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