"Research on Negative Bias Temperature Instability Effects Under the ..."

Chao Peng et al. (2021)

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DOI: 10.1109/ACCESS.2021.3056151

access: open

type: Journal Article

metadata version: 2025-04-22

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  - https://dblp.org/rec/journals/access/PengGLZCEH21
Chao Peng, Rui Gao, Zhifeng Lei, Zhangang Zhang, Yiqiang Chen, Yunfei En, Yun Huang:
Research on Negative Bias Temperature Instability Effects Under the Coupling of Total Ionizing Dose Irradiation for PDSOI MOSFETs. IEEE Access 9: 22587-22594 (2021)

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