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"Effect of Radiation on Interface Traps of SOI NMOSFETs by the ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Yangyang Li et al. (2019)

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DOI: 10.1109/ACCESS.2019.2935532

access: open

type: Journal Article

metadata version: 2023-09-30

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  dblp key:
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  - https://dblp.org/rec/journals/access/LiLLGYWLZLH19
Yangyang Li, Xiaojing Li, Bo Li, Linchun Gao, Weiwei Yan, Fangfang Wang, Duoli Li, Chuanbin Zeng, Jiajun Luo, Zhengsheng Han:
Effect of Radiation on Interface Traps of SOI NMOSFETs by the Direct-Current Current-Voltage Technique. IEEE Access 7: 115989-115996 (2019)

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