"Electrical Defect Imaging of ITO Coated Glass by Optical Microscope With ..."

Hanju Lee et al. (2019)

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DOI: 10.1109/ACCESS.2019.2907013

access: open

type: Journal Article

metadata version: 2025-01-19

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Hanju Lee, Zhirayr Baghdasaryan, Barry Friedman, Kiejin Lee:
Electrical Defect Imaging of ITO Coated Glass by Optical Microscope With Microwave Heating. IEEE Access 7: 42201-42209 (2019)

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