"A Gate Bias and Temperature Dependencies of Contact Resistances in ..."

Sungsik Lee (2021)

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DOI: 10.1109/ACCESS.2021.3134962

access: open

type: Journal Article

metadata version: 2023-08-28

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Sungsik Lee:
A Gate Bias and Temperature Dependencies of Contact Resistances in Amorphous Oxide Semiconductor Thin-Film Transistors. IEEE Access 9: 165085-165089 (2021)

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