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"Semiconductor Manufacturing Final Test Yield Optimization and Wafer ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Dan Jiang, Weihua Lin, Nagarajan Raghavan (2021)

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DOI: 10.1109/ACCESS.2021.3117576

access: open

type: Journal Article

metadata version: 2021-11-03

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Dan Jiang, Weihua Lin, Nagarajan Raghavan:
Semiconductor Manufacturing Final Test Yield Optimization and Wafer Acceptance Test Parameter Inverse Design Using Multi-Objective Optimization Algorithms. IEEE Access 9: 137655-137666 (2021)

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