"Automatic Test Case Generation Mechanism With Natural Language-Based ..."

Woosung Jang, Robert Young Chul Kim (2025)

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DOI: 10.1109/ACCESS.2025.3620431

access: open

type: Journal Article

metadata version: 2025-11-09

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Woosung Jang, Robert Young Chul Kim:
Automatic Test Case Generation Mechanism With Natural Language-Based Korean Requirement Specifications. IEEE Access 13: 177305-177317 (2025)

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