"Temperature Dependent Variations of Low-Frequency Noise Sources in ..."

Takumi Inaba et al. (2024)

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DOI: 10.1109/ACCESS.2024.3355588

access: open

type: Journal Article

metadata version: 2026-04-07

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Takumi Inaba, Hiroshi Oka, Hidehiro Asai, Hiroshi Fuketa, Shota Iizuka, Kimihiko Kato, Shunsuke Shitakata, Koichi Fukuda, Takahiro Mori:
Temperature Dependent Variations of Low-Frequency Noise Sources in Cryogenic Short-Channel Bulk MOSFETs. IEEE Access 12: 12458-12464 (2024)

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