"Contact-Less Integrity Verification of Microelectronics Using Near-Field ..."

Junjun Huan et al. (2023)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2023.3300222

access: open

type: Journal Article

metadata version: 2023-08-18

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/HuanDMB23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/HuanDMB23
Junjun Huan, Peyman Dehghanzadeh, Soumyajit Mandal, Swarup Bhunia:
Contact-Less Integrity Verification of Microelectronics Using Near-Field EM Analysis. IEEE Access 11: 80588-80599 (2023)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.