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ORCID"A Data-Driven Approach for Predicting Remaining Useful Life of ..."
- Yarens J. Cruz
, Fernando Castaño, Alberto Villalonga, Madhav Mishra, Rodolfo E. Haber:
A Data-Driven Approach for Predicting Remaining Useful Life of Semiconductor Devices Based on Machine Learning and Synthetic Data Generation: A Review and Case Study on SiC MOSFETs. IEEE Access 13: 138834-138850 (2025)
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