"Parametric Circuit Fault Diagnosis Through Oscillation-Based Testing in ..."

Jacob B. Cloete, Tinus Stander, Daniel N. Wilke (2022)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2022.3149324

access: open

type: Journal Article

metadata version: 2022-02-23

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/CloeteSW22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/CloeteSW22
Jacob B. Cloete, Tinus Stander, Daniel N. Wilke:
Parametric Circuit Fault Diagnosis Through Oscillation-Based Testing in Analogue Circuits: Statistical and Deep Learning Approaches. IEEE Access 10: 15671-15680 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.