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"Utilizing YOLO Models for Real-World Scenarios: Assessing Novel Mixed ..."
Vinod Kumar Ancha et al. (2024)
- Vinod Kumar Ancha

, Fadi N. Sibai
, Venkateswarlu Gonuguntla
, Ramesh Vaddi
:
Utilizing YOLO Models for Real-World Scenarios: Assessing Novel Mixed Defect Detection Dataset in PCBs. IEEE Access 12: 100983-100990 (2024)

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