"Utilizing YOLO Models for Real-World Scenarios: Assessing Novel Mixed ..."

Vinod Kumar Ancha et al. (2024)

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DOI: 10.1109/ACCESS.2024.3430329

access: open

type: Journal Article

metadata version: 2024-08-22

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Vinod Kumar Ancha, Fadi N. Sibai, Venkateswarlu Gonuguntla, Ramesh Vaddi:
Utilizing YOLO Models for Real-World Scenarios: Assessing Novel Mixed Defect Detection Dataset in PCBs. IEEE Access 12: 100983-100990 (2024)

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