"Extraction of Secrets from 40nm CMOS Gate Dielectric Breakdown Antifuses ..."

Andrew D. Zonenberg et al. (2025)

> Home

Details and statistics

DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2025-08-21

- view
  - electronic edition @ usenix.org (open access)
- export record
  dblp key:
  - conf/woot/ZonenbergMSAC25
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/woot/ZonenbergMSAC25
Andrew D. Zonenberg, Antony Moor, Daniel Slone, Lain Agan, Mario Cop:
Extraction of Secrets from 40nm CMOS Gate Dielectric Breakdown Antifuses by FIB Passive Voltage Contrast. WOOT 2025: 19-33

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.